Double-exposure method with synchrotron white X-ray for stress evaluation of coarse-grain materials

Suzuki, Kenji*; Shiro, Ayumi*; Toyokawa, Hidenori*; Saji, Choji*; Shobu, Takahisa

Quantum Beam Science (Internet), 4(3), p.25_1 - 25_14, 2020/09

https://doi.org/10.3390/qubs4030025

It is difficult to evaluate stress by the strain scanning method using a conventional diffractometer and a point detector since the two-dimensional diffraction pattern of a material composed of coarse grains does not have a ring but a spotty. To solve this problem, we proposed a double exposure method using a two-dimensional detector and monochromatized X-rays. In this study, we have developed a technique to apply that technique to white X-rays. The diffraction obtained by irradiating white X-rays for a material with of coarse grains becomes a Laue spot. Therefore, we have carried out developing a CdTe pixel two-dimensional detector that can limit the energy to be detected, and we evaluated the stress using that detector. As a result, we succeeded to measure the strain distribution of a bending specimen made to austenitic stainless steel. In the future, we would like to improve this technology and apply it to actual machine materials.

Mechanical Strength Evaluation of the Formed Bellows for the Ports of the JT-60 Vacuum Vessel

; Yamamoto, Masahiro; ; *; *; *

JAERI-M 83-077, 28 Pages, 1983/06

JAERI-M-83-077.pdf:1.34MB

no abstracts in English

Evaluation of materials strength at JRR-3

Shobu, Takahisa; Morooka, Satoshi; Xu, P. G.; Kurita, Keisuke; Sasaki, Miki; Shibayama, Yuki; Iikura, Hiroshi

no journal, , 

no abstracts in English